The Invention describes a new method to optimize the configuration of pixilated radiation detectors. This optimization is based on the Shannon-Nyquist sampling and interpolation theory, and makes it possible – by eliminating redundant information – to simultaneously observe the radiation in different energy ranges, using only one detector. The optimization of the detector configuration is such that effectively each radiation energy is recorded by the entire area of the detector. The efficiency of the detector is thereby maximized. The here-described detector optimization was successfully demonstrated for two major diagnostic systems, used for the x-ray spectroscopy of hot tokamak plasmas: (1) a high-resolution x-ray crystal spectrometer, and (2) a novel x-ray pinhole camera. It should be possible to apply this method to other areas of research,, such as in industry, or possibly homeland security where pixilated detectors are being used.